The 4141B DC source/monitor is designed for use as a system component in user-designed semiconductor I-V or DC parametric test systems. It features a wide DC measurement range, high resolution, high-speed measurement capabilities, remote sensing, and high accuracy. Four source/monitor units coupled with two voltage-source units, two voltage monitor units, and one ground unit make the 4141B equivalent to 21 instruments. A stand-alone instrument capable of measuring dc parameters, the 4141B features high resolution measurements (50 fA/100 µV) and a built-in timing controller. Typical time for a current or voltage measurement, which includes data transfer, is approximately 25 ms. A swept measurement (51 points) takes approximately 490 ms. Source and monitor units: 4 channels. Each source and monitor unit can be programmed to source voltage and monitor current, or conversely to source current and monitor voltage Voltage range: ±20 V, ±40 V, ±100 V Voltage resolution: 1 mV, 2 mV, 5 mV Current range: ±1000 pA to ±100 mA Current resolution: 1 pA to 10 µA Output/measurement resolution: Voltage: 4_ digits; Current: 4 digits Voltage source units: 2 channels Output voltage range: ±20 V Resolution: 1 mV Voltage monitor units: 2 channels Measurement voltage range: ±2 V, ±20 V Resolution: 100 µV, 1 mV Ground unit: 1 channel; Current range: ±500 mA
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